PRODUCTS

UL Metal Articulated Probe – Model ULP20-68

Model: ULP20
Standard: Standard:IEC 62368-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1, 60335-1

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The UL Metal Articulated Probe is a precision test finger designed to meet Underwriters Laboratories (UL) requirements found in numerous safety standards. Specifically crafted for evaluating access to hazardous parts by children, this jointed probe accurately replicates the dimensions and movement of a small hand. For applications requiring a non-flexing, rigid design for forceful insertion,

UL Metal Rigid Finger Probe – Model ULP25

Standard: Standard:IEC 62368-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1

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Durable and Precise Testing for Accessibility Safety The UL Metal Rigid Probe is designed for testing equipment accessible by children, adhering to all IEC, UL, and international safety standards. Unlike the flexible UL Metal Articulated Probe – Model ULP20-68, the ULP25 offers a rigid design for more forceful insertion where flexibility is insufficient. Made of

UL Plastic Articulated Probe – Model ULP04 – DISCONTINUED

Model: ULP04
Standard: UL PA 100A & UL 1492 Figure 18.1

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THIS ITEM HAS BEEN DISCONTINUED.

Jointed Finger Probe – Model JFP10

Model: JFP10
Standard: Standard:IEC 62368-1, Figure V.2; IEC 61032 Figure 2, Test Probe B; IEC 60529, Figure 1; IEC 60950, Clause 2.1.1.1b Figure 2A; IEC 60601-1:2005, Figure 7; IEC UL 1450, Figure 12.4; IEC 60335-2-3, Clause 21.

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This precision-engineered jointed finger probe is manufactured in full compliance with the IEC standards listed below and is also recognized for use in both Canadian and U.S. standards. Designed to simulate the movement and reach of a human hand, it features a palm simulator and restricted joint articulation to mimic realistic touch and access. The

Unjointed Finger Probe – Model UFP20

Model: UFP20
Standard: Standard:IEC 60950; IEC 60601; IEC 60335

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Precise, Forceful Testing for Safety Standards The UFP20 Unjointed Rigid Finger Probe is ideal for safety testing in accordance with IEC, CSA, and UL standards, particularly for applications requiring forceful insertion. This is the unjointed version of our Jointed Finger Probe – Model JFP10. Crafted from durable stainless steel for the finger and Delrin® for

Jointed Finger Probe for Testing Appliances

Model: JFP335-20.2
Standard: IEC 60335 Clause 20.2; EN 50636-2-107 Clause 20.102.4.2.2

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The JFP335-20.2 is one of the new accessibility probes required by IEC 60335-1 clause 20.2 for testing the accessibility of moving parts in appliances.

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14
Standard: IEC 60335

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The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders.  Meets the latest CB scheme requirements.

Wedge Probe for Testing Document Shredders

Model: NAF2
Standard: IEC 60950; IEC 62368-1, Figure V.4

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The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Telecommunications Access Probe – Model TAP40

Model: TAP40
Standard: Standard:IEC 62368-1, Clause V.1.4, Figure V.3; IEC 60950-1,Clause 2.1.1.d Figure 2c

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This high quality precision probe, Model TAP40, is supplied in accordance with all IEC standards listed below. It is also used for CSA and UL requirements. The Telecommunications Access Probe is designed to check for limited access to telecommunications voltages (TNV), mainly encompassing telephone jacks and operator areas. This probe complies with all the standards

Jointed Finger Probe

Model: JFP1089
Standard: GR-1089-CORE

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As required by Telecordia Standard GR-1089-CORE

Jointed Children’s Finger Probes (Set of 2) – Model JFP32

Model: JFP32
Standard: Standard:IEC 61032:1998, Figure 13 Test Probe 19;IEC 61032:1998, Figure 12 Test Probe 18;U.S. Federal Regulations, Title 16 Volume 2 Chapter 11 Part 1500 for Consumer Products

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The Jointed Children’s Finger Probes are supplied in a set of two. Model JFP32A is a simulation for zero to thirty six month old children. The second probe, Model JFP32B, is a simulation for three to fourteen year old children. These test fingers are used to test for protection against access to hazardous parts with

Unjointed Finger Probe – Model UFP25

Model: UFP25
Standard: Standard:IEC 61032:1998, Figure 7 Probe 11; IEC 61010-1:2001, Figure B.1; IEC 60601

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This high quality precision probe, Model UFP25, is supplied in accordance with all IEC standards listed below. It is also used for Canadian and USA standards. The Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe, Model JFP10, would be difficult. Ergonomics designs and manufactures these probes in

Fingernal test Probe, Model FNP335

Model: FNP335
Standard: IEC 60335-1, Clause 21.2 and 22.11, Figure 7

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IEC and UL testing security of snap-on parts.