PRODUCTS

UL Metal Articulated Probe – Model ULP20-68

Model: ULP20
Standard: Standard:IEC 62368-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1, 60335-1

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The UL Metal Articulated Probe is a precision test finger designed to meet Underwriters Laboratories (UL) requirements found in numerous safety standards. Specifically crafted for evaluating access to hazardous parts by children, this jointed probe accurately replicates the dimensions and movement of a small hand. For applications requiring a non-flexing, rigid design for forceful insertion,

UL Metal Rigid Finger Probe – Model ULP25

Standard: Standard:IEC 62368-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1

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Durable and Precise Testing for Accessibility Safety The UL Metal Rigid Probe is designed for testing equipment accessible by children, adhering to all IEC, UL, and international safety standards. Unlike the flexible UL Metal Articulated Probe – Model ULP20-68, the ULP25 offers a rigid design for more forceful insertion where flexibility is insufficient. Made of

UL Plastic Articulated Probe – Model ULP04 – DISCONTINUED

Model: ULP04
Standard: UL PA 100A & UL 1492 Figure 18.1

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THIS ITEM HAS BEEN DISCONTINUED.

Jointed Finger Probe – Model JFP10

Model: JFP10
Standard: Standard:IEC 62368-1, Figure V.2; IEC 61032 Figure 2, Test Probe B; IEC 60529, Figure 1; IEC 60950, Clause 2.1.1.1b Figure 2A; IEC 60601-1:2005, Figure 7; IEC UL 1450, Figure 12.4; IEC 60335-2-3, Clause 21.

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This precision-engineered jointed finger probe is manufactured in full compliance with the IEC standards listed below and is also recognized for use in both Canadian and U.S. standards. Designed to simulate the movement and reach of a human hand, it features a palm simulator and restricted joint articulation to mimic realistic touch and access. The

Test Pin Probe – Model TPP15

Model: TPP15
Standard: Standard:IEC 60950-1, Figure 2b;IEC 61032, Figure 9 Test Probe 13;IEC 60601,Figure 8

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High-Precision Accessibility Testing for Compliance The Model TPP15 Test Pin Probe is expertly crafted to meet IEC, CSA, and UL standards, ensuring precise testing for the accessibility of small objects in electrical safety applications. Designed and manufactured in-house, this stainless steel probe features a Delrin® handle for durability and ease of use. The pin tapers

Probe Kit for IEC 60950 – Model PK950

Model: PK950
Standard: Standard:IEC 60950; UL 1459; IEC 61010 - 1

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Safety Test Probe Kit PK950 contains the probes necessary for testing to IEC 60950: JFP10 – Jointed Finger Probe UFP20 – Unjointed (Rigid) Finger Probe TPP15 – Test Pin Probe ITB15 – Ø50mm Impact Test Ball, 500 grams TAP40 – Telecommunications Access Probe This kit includes a case to protect and safely transport your probes.

Test Pin Probe – Model TPP50

Model: TPP50
Standard: IEC 61032-1998, Figure 8, Test Probe 12

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This precision probe is used to test for accessibility according to the latest IEC, CSA, and UL requirements. The probe is made of a Ø 4mm stainless steel rod that is 50mm in length, and connected to a Delrin Handle.

Test Hook Probe

Model: THP601
Standard: IEC 60601-1-2005, Figure 7; IEC 62368-1, Figure 20; IEC 60065, Figure 4

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IEC testing of integrity of enclosure seams.

Saw Blade Accessibility Probe


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These test probes are safety requirements for the use of saws, as per the standards defined below. These precise probes are fabricated to confirm saw teeth blades are not in any proximity of the guards or the operator at any time. These probes also ensure it is not possible to touch any dangerous moving parts

Jewelry Probe – 3 mm diameter, Model JP03 – DISCONTINUED

Model: JP03
Standard: IEC 61010-1, Clause 6.2.4

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This probe has been discontinued and has been replaced with the HP03. The HP03 is also manufactured to IEC 61010-1, Clause 6.2.4. This probe simulates jewelry to IEC 61010-1, Clause 6.2.4. The probe length is 100 mm long, and is made of white Delrin, The probe diameter is made of steel and is 3 mm

50mm Diameter Ball Accessibility Probe with Handle – Model ITB20

Model: ITB20
Standard: IEC 61032, Figure 1 Test Probe A; IEC 61032, Figure 5 Test Probe 1; IEC 60529, Table 6; IEC 60529, Figure M.1; UL 1082

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This 50mm diameter Ball Accessibilty Probe is a specially machined assembly to test impact resistance and accessibility  according to IEC standards below, as well CSA and UL standards. This assembly consists of three (3) components.  The first item is Ergonomics item ITB15, a 50 mm diameter impact test ball.   The impact ball is connected to

Food Waste Probe

Model: FWP10
Standard: 61032-1998 Figure 14, probe 31

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The FWP10 Food Waste Probe is used for checking food waste disposal units. It is used to test to the following standards: IEC60335-2-16, IEC61032 and UL430.

Amusement Ride Machine Probe

Model: AP75

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This is a 75mm sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-24, clause 20.2. It is made of aluminum to conserve weight.

Amusement Ride Machine Probe

Model: AP150

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This Amusement Machine Probe is a 150mm wooden sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-82, clause 20.2. It is made of wood to conserve weight.

Unjointed Finger Probe – Model UFP20

Model: UFP20
Standard: Standard:IEC 60950; IEC 60601; IEC 60335

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Precise, Forceful Testing for Safety Standards The UFP20 Unjointed Rigid Finger Probe is ideal for safety testing in accordance with IEC, CSA, and UL standards, particularly for applications requiring forceful insertion. This is the unjointed version of our Jointed Finger Probe – Model JFP10. Crafted from durable stainless steel for the finger and Delrin® for

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14
Standard: IEC 60335

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The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders.  Meets the latest CB scheme requirements.

Wedge Probe for Testing Document Shredders

Model: NAF2
Standard: IEC 60950; IEC 62368-1, Figure V.4

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The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Jointed Finger Probe

Model: JFP1089
Standard: GR-1089-CORE

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As required by Telecordia Standard GR-1089-CORE

Unjointed Finger Probe – Model UFP25

Model: UFP25
Standard: Standard:IEC 61032:1998, Figure 7 Probe 11; IEC 61010-1:2001, Figure B.1; IEC 60601

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This high quality precision probe, Model UFP25, is supplied in accordance with all IEC standards listed below. It is also used for Canadian and USA standards. The Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe, Model JFP10, would be difficult. Ergonomics designs and manufactures these probes in

Test Rod Probes


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Several models to choose from… To test to many IEC standards and UL standards.

Coin Probe

Model: CP10
Standard: UL 1410 and 6500

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4 coins in one – checks access by US coins. UL Standard

Blunt Probe

Model: BP10
Standard: UL 1310

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The Blunt Probe is used in UL 1310 Standard for Class 2 Power Units.